The EDX3000 precious metals analyser has been developed incorporating a number of technologies improving measurement performance. The EDX3000 has an electronically cooled Si-PIN semiconductor detector and Skyray’s patented Signal-to-Noise Enhancer greatly improving accuracy and stability of the measurement. It also contains an in-built high resolution camera for sample inspection and a powerful software suite enabling detailed analysis.
Instrument UK
Simple User Interface
Analyser Software
Clear Presentation of Results including Carat
and Easy Report Printing