Handheld Explorer, Genius, Pocket III
Precious Metals EDX600, EDX880, EDX3000
Professional RoHS EDX2800, EDX1800B
Full -Element EDX3600B, EDX3600H, EDX6000B
Plating Thickness Thick 800A
Wavelength Dispersive WDX Series
Plasma Spectroscopy ICP 2000
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About Us
Alloys analysis and Positive Material Identification (PMI) are increasingly becoming an important integral part of a quality control and safety management in many industries. Alloys analysis and PMI ensure that the tested part is of the correct quality or grade required. Those parts that do not have correct composition or grade will have different properties (for strength, corrosion or temperature resistance for example) and if used could have disastrous effects.
XRF is increasingly used in many industries now to identify the composition and grade of many alloys, whether it is for checking raw material in, final product or just for scrap sorting or identifying unlabelled material in stock.
The Genius 5000 is a widely used alloy analyser in the metal industry for range of analyses including checking alloy grade, positive material identification, compositional analysis, scrap metal identification and more. The Genius is a higher performance handheld XRF analyser incorporating the best silicon drift detector on the market providing the level of accuracy, precision and speed required for such complex analysis today. The Genius can detect Mg through to U so is capable of detecting the lighter elements (so can be used for testing aluminium alloys) and has an inbuilt HD camera for those times where you may need to test a particular point on the sample.
Some applications include:
Instrument UK
The Genius XRF is small, light and powerful, providing fast non-destructive on-site analysis of samples. Samples can be solid, liquid or powder and require no preparation before measurement. A high resolution PDA operating Windows CE with Bluetooth communication, personal data handling, report generation (in Microsoft XL format) and email capabilities provides graphical and numerical analysis of measurements to the level you require. An inbuilt GPS facility helps accurately pinpoint the location of the measurement in the field.
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EDX 6000B |
WDX Series |
ICP2000 Plasma Spectrometer |
Genius3000 - RoHS |
Genius5000 - Alloys |
Genius7000 - Mining |
Genius9000 - Soil |
RoHS Screening by XRF |
RoHS Screening Flow Chart |
Pulstec |
Xiris |
Nimbus Mastering |
Mastering Technologies Ltd |
Skyray XRF Analysers |
Optical Disc |
Product Listing |
Application Listing |
Handheld Analysers |
Precious Metals Analysers |
RoHS Screening |
Genius XRF |
Explorer |
Pocket III |
EDX 600 |
EDX 880 |
EDX 1800B |
EDX 3000 |
Thick 800A |
EDX 3600B |
EDX 3600H |
EDX 6000B |
WDX Series |
ICP2000 Plasma Spectrometer |
Genius3000 - RoHS |
Genius5000 - Alloys |
Genius7000 - Mining |
Genius9000 - Soil |
RoHS Screening by XRF |
RoHS Screening Flow Chart |
Pulstec |
Xiris |
Nimbus Mastering |
Mastering Technologies Ltd |