Handheld Explorer, Genius, Pocket III
Precious Metals EDX600, EDX880, EDX3000
Professional RoHS EDX2800, EDX1800B
Full -Element EDX3600B, EDX3600H, EDX6000B
Plating Thickness Thick 800A
Wavelength Dispersive WDX Series
Plasma Spectroscopy ICP 2000
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The Thick800A XRF Analyser is designed for rapid and non-destructive analysis of plating layer thickness and compositions of plating and plating solutions. Some features of the Thick 800A include:
Altitude Transducer.
Si-PIN Semiconductor Detector.
Measurement of up to 5 plating layers.
Micro collimator to improve testing accuracy.
Elements: Na to U (more than 24 simultaneously).
Content Range: 1 ppm - 99.99%.
Repeatability: 0.1%
Long period stability: 0.1%
Dimensions: 648 x 490 x 544 mm
Sample Chamber: 517 x 352 x 150 mm
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